Advances in X-ray analysis /

Bibliographic Details
Corporate Author: Conference on Application of X-ray Analysis
Other Authors: Birks, LaVerne Stanfield (ed.), Barrett, Charles Sanborn, 1902-1994 (ed.), Newkirk, John B. (ed.), Ruud, Clayton O. (ed.)
Format: Conference Proceeding Book
Language:English
Published: New York : Plenum, 1973-
Subjects: