Scanning electron microscopy : physics of image formation and microanalysis /

Bibliographic Details
Main Author: Reimer, Ludwig, 1928-
Format: Book
Language:English
Published: Berlin : Springer, c2010.
Edition:2nd completely rev. and updated ed.
Series:Springer series in optical sciences ; v. 45
Subjects:
Description
Physical Description:xiv, 527 p. : il. ; 24 cm.
Bibliography:Incluye referencias bibliográficas e índice.
ISBN:9783642083723