Principles of analytical electron microscopy /

Bibliographic Details
Other Authors:	Joy, David C., 1943-, Romig, Alton D., Goldstein, Joseph, 1939-
Format:	Book
Language:	English
Published:	New York : Plenum, 1989.
Subjects:	Scanning probe microscopes and component. Electron microscopy. Microscopía electrónica.

MARC


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245	0	0	\|a Principles of analytical electron microscopy / \|c edited by David C. Joy, Alton D. Romig, Jr. and Joseph I. Goldstein.
260			\|a New York : \|b Plenum, \|c 1989.
300			\|a xvi, 448 p. : \|b il. ; \|c 26 cm.
504			\|a Incluye bibliografía e índice.
650		4	\|a Scanning probe microscopes and component.
650		4	\|a Electron microscopy.
650		4	\|a Microscopía electrónica.
700	1		\|9 8483 \|a Joy, David C., \|d 1943-
700	1		\|9 14666 \|a Romig, Alton D.
700	1		\|9 6411 \|a Goldstein, Joseph, \|d 1939-
541			\|a Programa de Bibliotecas Resolución 501/09 \|c Compra \|d 2010-08-27 \|e 20582 \|h $522 \|o Libro
942			\|c LIBRO
945			\|a MCR \|d 2010-08-27
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