Scanning and transmission electron microscopy : an introduction /

Bibliographic Details
Main Author:	Flegler, Stanley L.
Other Authors:	Heckman, John William, Klomparens, Karen L.
Format:	Book
Language:	English
Published:	New York ; Oxford : Oxford University, 1993.
Subjects:	Scanning probe microscopes and components. Scanning electron microscopy. Transmission electron microscopy.

MARC


LEADER	00000nam a22000007a 4500
003	AR_CdUFM
005	20160908124535.0
008	000329s1993 nyu \| 00\| 0 eng d
020			\|a 9780195107517
040			\|a UCAR \|c AR_CdUFM \|d AR_CdUFM
100	1	0	\|9 5312 \|a Flegler, Stanley L.
245	1	0	\|a Scanning and transmission electron microscopy : \|b an introduction / \|c Stanley L. Flegler, John William Heckman, Jr., Karen L. Klomparens.
260	0		\|a New York ; \|a Oxford : \|b Oxford University, \|c 1993.
300			\|a 225 p. \|c ; 26 cm
650		4	\|a Scanning probe microscopes and components.
650		4	\|a Scanning electron microscopy.
650		4	\|a Transmission electron microscopy.
700	1	0	\|9 7334 \|a Heckman, John William.
700	1	0	\|9 9040 \|a Klomparens, Karen L.
541			\|a Importación de Publicaciones ; \|c Compra Programa de Bibliotecas. Res. 1038/10 ; \|d 2011-07-21 ; \|e 21038 ; \|h $360 ; \|o Libro
942			\|c LIBRO
945			\|a MCR \|d 2011-07-21
952			\|0 0 \|1 0 \|2 PACS \|4 0 \|6 F_0779_FLE \|7 0 \|9 20399 \|a MMA \|b MMA \|c 3 \|d 2011-07-21 \|e Programa de Bibliotecas Res. 1038/10: Importación de Publicaciones \|g 0.00 \|l 2 \|m 2 \|o F 07.79 FLE \|p 21038 \|r 2022-06-28 00:00:00 \|s 2022-04-13 \|w 2011-07-21 \|y LIBRO
999			\|c 16016 \|d 16015