Physical principles of electron microscopy : an introduction to TEM, SEM and AEM /

Bibliographic Details
Main Author: Egerton, Ray F.
Format: Book
Language:English
Published: New York : Springer, 2005.
Subjects:
Online Access:Table of contents
Publisher description
Description
Physical Description:xii, 202 p. : il. ; 24 cm.
Bibliography:Includes bibliographical references (p. [195]-196) and index.
ISBN:9780387258003